영상 부분 제조사 설명 MOQ 재고 행동
SN74BCT8373ADW Texas Instruments
IC SCAN TEST DEVICE LATCH 24SOIC
43 견적 받기
SN74BCT8373ADWRG4 Texas Instruments
IC SCAN TEST DEVICE 24SOIC
1 견적 받기
SN74BCT8373ADWR Texas Instruments
IC SCAN TEST DEVICE LATCH 24SOIC
88 견적 받기
SN74BCT8373ADWRE4 Texas Instruments
IC SCAN TEST DEVICE LATCH 24SOIC
1 견적 받기
SN74BCT8373ANT Texas Instruments
IC SCAN TEST DEVICE LATCH 24-DIP
55 견적 받기
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