영상 부분 제조사 설명 MOQ 재고 행동
SN74BCT8240ADW Texas Instruments
IC SCAN TEST DEVICE BUFF 24-SOIC
43 견적 받기
SN74BCT8240ADWRG4 Texas Instruments
IC SCAN TEST DEVICE 24SOIC
1 견적 받기
SN74BCT8240ADWR Texas Instruments
IC SCAN TEST DEVICE BUFF 24-SOIC
44 견적 받기
SN74BCT8240ADWRE4 Texas Instruments
IC SCAN TEST DEVICE BUFF 24-SOIC
1 견적 받기
SN74BCT8240ANT Texas Instruments
IC SCAN TEST DEVICE BUFF 24-DIP
44 견적 받기
SN74BCT8240ANTG4 Texas Instruments
IC SCAN TEST DEVICE BUFF 24-DIP
1 견적 받기
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